32G SerDes

Innosilicon 32G SerDes PHY is a highly configurable PHY supporting speeds up to 32Gbps within a single lane. The 32G Serdes is compatible with PCIe 5/4/3 and next generation PCIe standard protocols, as well as various serial interface protocols (Rapid IO/XAUI/SATA/fiber channel/10G Ethernet etc.). High data rates are accurately achieved through fully programmable TX drivers and auto-calibrated on-die terminations.

32G SerDes

The PHY is physically configured in order to support multi-lane solutions. There is a common block with TX PLL, reference clock input, bandgap, bias circuitry, and termination calibration. This common block can then support up to 4 lanes of TX/RX.

The PHY is fully compliant with the following standards: HMC-32G25G/12.5G -VSR/SR/MR, PCI Express 5.0/4.0/3.0, USB3.1/3.0, FC Serdes, RapidIO3.1/2.x/1.x, CPRI 5.0, XAUI:10GBASE-KX-4/RXAUI, SGMII/10G KR/100G KR-4, SATA3.0/SAS3.0, CEI-6G SR/CEI-11G SR/CEI-32G VSR/MR, JESD204B/204C, Customized SerDes.

Test Eye-diagram & Jitter Histogram （32Gbps）

Benefits
Features
Deliverables
Applications

Offers leading performance, power, and area per terabit
Optional PI/SI and thermal co-design service
Full support from IP delivery to production

Reference Clock

19.2-300MHz, integer multiple of Serial output (100MHz for PCIe)
+/-300ppm frequency stability (<20Gbps)
+/-100ppm frequency stability (>=20Gbps)
Supports both SRNS & SRIS modes
Configurable as reference clock repeater

Internal PLL

Used to drive all PHY transmitters and receivers
LC-tank architecture operational from 16-32 Gbps
Ring PLL covering 1.0-16Gbps
Programmable pre-divider & feedback divider
Initiative SSC or reference clock based passive SSC
LOCK indication

Data Transmit

Rates supported from 1.0-32 Gbps
AC coupled
50Ω impedance, internally calibrated
200-1100mV differential peak-peak, programmable
3 tap pre/post-cursor de-emphasis, programmable
Programmable Rise/Fall times

Data Receive

AC coupled
50Ω impedance, internally calibrated
200-1200mV differential peak-peak
CTLE, programmable
DFE, 6-tap programmable
CDR

Testing

Scan
BIST with PRBS7, PRBS23 and PRBS31(PG & SD)
Loopback (near-end , far-end, on/off-die)
On-chip scope (eye height & width)
Analog and digital probe points
HTOL
IDDQ

ESD

HBM 2000V, [JEDEC JS-001-2014]
MM 100V, [JEDEC JESD22-A115C]
CDM 250V, [JEDEC JESD22-C101F]

Latch Up

+-200mA for IO and 1.5*Vsupply for power rails

Package

Wire bond with careful SI/PI analysis for 8Gbps and below
Flip-Chip with careful SI/PI analysis for 8Gbps and up

Interface with controller

PIPE4.3 & 32 bits data bus for PCIe and USB3.x
SAPIs for SATA3.0
UTMI+ (level3) 8/16bit for USB2.0 (as a separated IP not described in this document)
XGMII for XAUI and 10GbE
SerDes interface for customized PCS

LEF
Place-and-route abstracts
GDSII files
LVS netlists
Optional extracted HSPICE netlist for I/Os
Data book, Application notes
Silicon validation and ESD testing results
Optional PCB reference design and Package Electrical Model
Documentation

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